On the characterisation of a Bragg spectrometer with X-rays from an ECR source
D. F. Anagnostopoulos, S. Biri, D. Gotta, A. Gruber, Paul Indelicato, B. Leoni, H. Fuhrmann, L. M. Simons, L. Stingelin, A. Wasser, J. Zmeskal
Abstract
Narrow X-ray lines from helium-like argon emitted from a dedicated ECR source have been used to determine the response function of a Bragg crystal spectrometer equipped with large area spherically bent silicon (111) or quartz (101) crystals. The measured spectra are compared with simulated ones created by a ray-tracing code based on the expected theoretical crystal's rocking curve and the geometry of the experimental set-up.
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