Inferring the success parameter p of a binomial model from small samples affected by background
G. D'Agostini
Abstract
The problem of inferring the binomial parameter p from x successes obtained in n trials is reviewed and extended to take into account the presence of background, that can affect the data in two ways: a) fake successes are due to a background modeled as a Poisson process of known intensity; b) fake trials are due to a background modeled as a Poisson process of known intensity, each trial being characterized by a known success probability pb.
Create a lesson
Related papers
Reduced latent leakage does not reliably predict lower likelihood bias in collider inference
Tong Pan
The Greedy Bump Bias: Local Profiling Geometry and the Look-Elsewhere Effect
Tommaso Dorigo
Multi-fidelity Monte Carlo estimation of floor response spectra under combined seismic and structural parameter uncertainties
Nils Baillie, Baptiste Kerleguer, Cyril Feau et al.
Parameter inference from a non-stationary unknown process using statistical feature-based slow feature analysis
Kieran S. Owens, Masako Tamaki, Ben D. Fulcher
A Probability Model for Pentagonal Prism Dice Rolls
Paul R. Hurst, J. Naleo Hyde
Geometry-native machine learning reconstruction of DSMC moment fields with support monitoring
Ehsan Roohi