An optical fiber-taper probe for wafer-scale microphotonic device characterization
C. P. Michael, M. Borselli, T. J. Johnson, C. Chrystal, O. Painter
Abstract
A small depression is created in a straight optical fiber taper to form a local probe suitable for studying closely spaced, planar microphotonic devices. The tension of the "dimpled" taper controls the probe-sample interaction length and the level of noise present during coupling measurements. Practical demonstrations with high-Q silicon microcavities include testing a dense array of undercut microdisks (maximum Q = 3.3x106) and a planar microring (Q = 4.8x106).
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