Quantum Zeno and anti-Zeno effects by indirect measurement with finite errors
Kazuki Koshino, Akira Shimizu
Abstract
We study the quantum Zeno effect and the anti-Zeno effect in the case of `indirect' measurements, where a measuring apparatus does not act directly on an unstable system, for a realistic model with finite errors in the measurement. A general and simple formula for the decay rate of the unstable system under measurement is derived. In the case of a Lorentzian form factor, we calculate the full time evolutions of the decay rate, the response of the measuring apparatus, and the probability of errors in the measurement. It is shown that not only the response time but also the detection efficiency plays a crucial role. We present the prescription for observing the quantum Zeno and anti-Zeno effects, as well as the prescriptions for avoiding or calibrating these effects in general experiments.
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