Quantum calibration of measuring apparatuses
Giacomo Mauro D'Ariano, Lorenzo Maccone, Paoloplacido Lo Presti
Abstract
By quantum calibration we name an experimental procedure apt to completely characterize an unknown measurement apparatus by comparing it with other calibrated apparatuses. Here we show how to achieve the calibration of an arbitrary measuring apparatus, by using it in conjunction with a ``tomographer'' in a correlation setup with an input bipartite system. The method is robust to imperfections of the tomographer, and works for practically any input state of the bipartite system.
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