Observation of Four-Photon de Broglie Wavelength by State Projection Measurement
F. W. Sun, B. H. Liu, Y. F. Huang, Z. Y. Ou, G. C. Guo
Abstract
A measurement process is constructed to project an arbitrary two-mode N-photon state to a maximally entangled N-photon state (the NOON-state). The result of this projection measurement shows a typical interference fringe with an N-photon de Broglie wavelength. For an experimental demonstration, this measurement process is applied to a four-photon superposition state from two perpendicularly oriented type-I parametric down-conversion processes. Generalization to arbitrary N-photon states projection measurement can be easily made and may have wide applications in quantum information. As an example, we formulate it for precision phase measurement.
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