Identification and Distance Measures of Measurement Apparatus
Zhengfeng Ji, Yuan Feng, Runyao Duan, Mingsheng Ying
Abstract
We propose simple schemes that can perfectly identify projective measurement apparatus secretly chosen from a finite set. Entanglements are used in these schemes both to make possible the perfect identification and to improve the efficiency significantly. A brief discussion on the problem of how to appropriately define distance measures of measurements is also provided based on the results of identification.
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