Process tomography of ion trap quantum gates
M. Riebe, K. Kim, P. Schindler, T. Monz, P. O. Schmidt, T. K. Koerber, W. Haensel, H. Haeffner, C. F. Roos, R. Blatt
Abstract
A crucial building block for quantum information processing with trapped ions is a controlled-NOT quantum gate. In this paper, two different sequences of laser pulses implementing such a gate operation are analyzed using quantum process tomography. Fidelities of up to 92.6(6)% are achieved for single gate operations and up to 83.4(8)% for two concatenated gate operations. By process tomography we assess the performance of the gates for different experimental realizations and demonstrate the advantage of amplitude--shaped laser pulses over simple square pulses. We also investigate whether the performance of concatenated gates can be inferred from the analysis of the single gates.
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