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Physics-informed Machine Learning Prediction of Hubbard Interaction Parameters

Jiyeon Kim, Indukuru Ramesh Reddy, Bongjae Kim, Sooran Kim

cond-mat.mtrl-sciarXiv:2607.26422

Abstract

Accurate determination of Hubbard interaction parameters is essential for beyond-DFT approaches such as DFT+U, DFT+DMFT, and DFT+U+V in correlated materials. In practice, however, these parameters are often chosen empirically, limiting their transferability across materials. Advanced computational approaches such as the constrained random-phase approximation (cRPA) provide a rigorous route for evaluating Hubbard interactions, but their computational cost remains a bottleneck for large-scale materials screening. Here, we present machine-learning (ML) models for predicting cRPA-derived Hubbard interaction parameters: effective on-site U eff, inter-site V, and Hund's coupling J for transition-metal oxides (TMOs). We combine ensemble-learning models with a regression-based brute-force search (BFS) approach to achieve both predictive accuracy and explicit analytical expressions. We construct features that capture electronic, structural, and atomic properties, including the TM-d bandwidth and TM-d/O-p band-center separation, as physically motivated descriptors of localization and screening. Our ensemble models achieve RMSEs of 0.148 eV, 0.062 eV, and 0.007 eV for U eff, V, and J, respectively. The derived analytical forms directly relate U eff to electron localization and TM-d/O-p hybridization, suggest the importance of hybridization and structural compactness in determining V, and indicate that J is governed primarily by elemental descriptors of the TM ion. Together, the present study provides an efficient approach for predicting cRPA-derived U eff, V, and J, while offering physical insight into the factors underlying these Hubbard interactions.

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