A versatile generalized digital twin for Electron Microscopy

Abstract

Development of specialized imaging and spectroscopy states in transmission electron microscopy is needed for novel applications, such as flexible momentum-resolved high energy-resolution spectroscopy. This task is complicated by the need to align and configure many different lenses, and by ambiguity as to the locations of various imaging and diffraction planes, which are often not well documented. Here we develop a versatile digital twin for simulating the electron beam trajectory throughout an electron microscope. Our code package contains simple tools for modeling the microscope column, and we present multiple procedures for dialing in precise lens locations and calibrating lens models. This enables use of the model as a predictive tool, allowing the user to quickly and easily determine the correct lens values for setting up new condenser or projector modes. Automatic procedures to change lens settings and measure the resulting changes can be used to close the loop. With the accelerating development of machine learning and artificial intelligence tools, we also believe a physically-informed model of the microscope can serve as a valuable tool for automated microscopy and AI/ML integration.