Radiation Hardness of Commercially Available NUV-MT Silicon Photomultipliers

Abstract

Silicon Photomultipliers (SiPMs) based on the near-ultraviolet, metal-filled trench (NUV-MT) technology offer improved photon detection efficiency and reduced correlated noise relative to earlier designs, making them attractive for a broad range of particle- and astroparticle-physics applications. As such devices may be deployed in high-radiation environments, quantifying their performance after irradiation is essential. Commercially available Broadcom AFBR-S4N series NUV-MT SiPMs were irradiated with 1 MeV neutrons to fluences between 2x10^{9} and 1.1x10^{10} n_{eq}/cm^2 at the TANDEM accelerator facility of NCSR "Demokritos" in Athens, and characterised before and after irradiation and over successive thermal-annealing stages. Irradiation increased the dark noise by up to three orders of magnitude and degraded the single-photon resolution by up to a factor of ten, with resolution lost entirely at the highest fluence, while no shift in breakdown voltage was observed. Thermal annealing partially recovered the performance, reducing the dark noise by up to a factor of two and restoring the single-photon resolution.