From Physical Devices to RTL Models: Abstraction and Validation in Hardware Engineering
Wolfgang Ecker, Natalie Simson, Johannes Ecker, Endri Kaja
Abstract
This paper introduces the foundational principles underlying hardware engineering models and argues that abstraction is their defining characteristic. Because abstraction necessarily omits detail and constrains what engineers can build, models are inherently incomplete in specific respects - or, as George Box famously observed, "All models are wrong, but some are useful". At the same time, abstraction is essential for simplification, which is key to managing complexity. More abstract models also tend to simulate faster because fewer details must be considered. This paper subsequently examines a range of abstraction methods in digital design - sometimes referred to as design disciplines - including lumped models, value-discrete models, and time-discrete models. Together with constraints that define the validity of the abstraction and design guidelines, these abstraction methods establish design disciplines. This paper further relates these forms of abstraction to pre-clustered design elements such as transistors, gates, registers, and transfer functions. These pre-clustered elements define abstraction levels, such as the gate level, and are presented as a key enabler of increased design productivity.
Create a lesson
Related papers
Catscan: Visualizing Pipelines of CPU Performance Simulation
Aaron Lindsay, Nicholas Kelly, Scott Witscher et al.
CONFERM: Recurrence-Aware Temporal Mapping for Multi-Cycle Multi-Context CGRAs
Jun Yin, Jannes Willemen, Stef Cuyckens et al.
Timing-Driven Logic Remapping with Local Physical Context
Zijian Jiang, Hongyang Pan, Cunqing Lan et al.
ZTA-Q: an Open-source RISC-V Platform for Accurate Quantized CNN Inference
Yike Li, Ajay Kumar M, Vishnu PS et al.
Open-Source Multi-Wire SPI Readout for Wearable Ultrasound Probes
Federico Villani, Soumyo Bhattacharjee, Lisa Odermatt et al.
U-Sonic: An Open-Source 8-Channel Ultrasound Transmit IP in a 130 nm RISC-V SoC
Federico Villani, Nico Canzani, Marc-André Wessner et al.