Probing fluctuations in photon emission statistics of spin injected quantum dots with time dependent electronic excitation
Chiran Wijesundara, Vincent Iglesias-Cardinale, Yuan Lu, Herbert Fotso, Bo Xu, Tim Thomay
Abstract
Electrically spin-injected ensembles of InGaAs/GaAs quantum dots emit circularly polarized single photons, with the emission helicity determined by the spin polarization of the injected electrons. A ferromagnetic CoFeB spin-injection layer with perpendicular magnetic anisotropy, combined with an MgO tunnel barrier, enables spin-polarized electron injection into the quantum-dot active region, resulting in circularly polarized photon emission at zero applied magnetic field. These devices realize direct spin-charge-photon conversion in an electrically driven, microelectronics-compatible quantum light source that operates without an external pump laser. Using an extended Hanbury Brown-Twiss interferometer with four detectors and time-tagged readout, we measure time-resolved photon-number statistics that resolve up to |2 Fock states within a single excitation cycle. While single-photon (n=|1) emission tracks the electrical excitation pulse as expected, the two-photon (n=|2) statistics exhibit pronounced fluctuations at multiple temporal positions within the pulse. These fluctuations vanish upon demagnetization of the spin-injection layer, establishing a direct link between the multi-photon emission dynamics and the spin polarization of the injected carriers. The observations indicate that spin injection controls not only the helicity of the emitted photons but also higher-order temporal correlations of the emission. The behavior is phenomenologically captured by inserting both a variable excitation mechanism and a set of multi-emitter collapse operators within a stochastic wave function evolution. The platform thus opens a route to electrically driven, spin-controlled single and multi-photon Fock-state sources and provides a testbed for spin-conditioned multi-emitter dynamics in solid-state quantum light sources.
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