Entangled Measurement Outcomes for Optimal Postselection in Quantum Batteries
Yali Du, Zhipei Zhou, Xiaoli Hu
Abstract
Postselection can enhance the performance of a selected quantum battery branch, raising the question of whether the optimum can always be achieved by product measurements on the auxiliary subsystems. For battery auxiliary states obtained by mixing a pure state with global white noise of strength p, the conditional ergotropy reduces to a generalized Rayleigh quotient. For 0<p<1, product postselection attains the joint optimum if and only if the eigenspace associated with the largest generalized eigenvalue contains a product vector. For two auxiliary qubits, a strict product-joint gap therefore occurs precisely when this eigenspace is one dimensional and spanned by an entangled vector. Noisy W and GHZ states display qualitatively different behavior: the three qubit W state exhibits a strict gap throughout 0<p<1, whereas the three qubit GHZ state admits a product optimum. For interacting two qubit batteries, the optimal postselection can switch from a Bell outcome to a product outcome as the coupling strength is varied. By contrast, the outcome averaged capacity and ergotropy are independent of the measurement basis, showing that the joint measurement advantage is genuinely postselective.
Create a lesson
Related papers
Testing Gravitationally-Induced-Entanglement with Massive Particles and Quantum Clocks
Germain Tobar, Markus Aspelmeyer, Magdalena Zych
Recovery gates as a resource in repetition-code process tomography: exhaustive gate-optimal designs for three, five and seven qubits
Long Huang
Beyond Quantum Messages: Toward Quantum-Native Network Functioning
Angela Sara Cacciapuoti, Jessica Illiano, Caterina De Risi et al.
Dualities in one-dimensional quantum lattice models: Lie groups, Schur-Weyl duality and symmetry breaking
Dante Bosgoed, Frank Verstraete, Laurens Lootens
Entropic measures of quantum information
Roberto Rubboli, Bartosz Regula, Mario Berta et al.
Certifying quantum code and circuit distances at scale
Bin Cheng, Naixu Guo, Feng Pan