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Unusual Tc variation with hole concentration in Bi2Sr2-xLaxCuO6+δ

Mu-Yong Choi, J. S. Kim

cond-mat.supr-conarXiv:cond-mat/0001339

Abstract

We have investigated the Tc variation with the hole concentration p in the La-doped Bi 2201 system, Bi2Sr2-xLaxCuO6+δ. It is found that the Bi 2201 system does not follow the systematics in Tc and p observed in other high-Tc cuprate superconductors (HTSC's). The Tc vs p characteristics are quite similar to what observed in Zn-doped HTSC's. An exceptionally large residual resistivity component in the inplane resistivity indicates that strong potential scatterers of charge carriers reside in CuO2 planes and are responsible for the unusual Tc variation with p, as in the Zn-doped systems. However, contrary to the Zn-doped HTSC's, the strong scatter in the Bi 2201 system is possibly a vacancy in the Cu site.

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