Microwave Power, DC Magnetic Field, Frequency and Temperature Dependence of the Surface Resistance of MgB2
A. A. Zhukov, A. Purnell, Y. Miyoshi, Y. Bugoslavsky, Z. Lockman, A. Berenov, J. L. MacManus-Driscoll, L. F. Cohen, H. Y. Zhai, H. M. Christen, M. P. Paranthaman, D. H. Lowndes, M. H. Jo, M. G. Blamire, Ling Hao, J. C. Gallop
Abstract
The microwave power, dc magnetic field, frequency and temperature dependence of the surface resistance of MgB2 films and powder samples were studied. Sample quality is relatively easy to identify by a number of characteristics, the most clear being the breakdown in the omega squared law for poor quality samples. Analysis of the experimental data suggests the most attractive procedure for high quality film growth for technical applications.
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