Detection of quantum noise from mesoscopic devices with an SIS detector
R. Deblock, E. Onac, L. Gurevich, L. P. Kouwenhoven
Abstract
Quantum mechanics can strongly influence the noise properties of mesoscopic devices. To probe this effect we have measured the current fluctuations at high-frequency (5-90G Hz) using a superconductor-insulator-superconductor tunnel junction as an on-chip spectrum analyzer. By coupling this frequency-resolved noise detector to a quantum device we can measure the high-frequency, non-symmetrized noise as demonstrated for a Josephson junction. The same scheme has been used to detect the current fluctuations arising from coherent charge oscillations in a two-level system, a superconducting charge qubit. A narrow band peak was observed in the spectral noise density at the frequency of the coherent charge oscillations.
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