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Critical Casimir force in 4He films: confirmation of finite-size scaling

A. Ganshin, S. Scheidemantel, R. Garcia, M. H. W. Chan

cond-mat.softarXiv:cond-mat/0605663

Abstract

We present new capacitance measurements of critical Casimir force-induced thinning of 4He films near the superfluid/normal transition, focused on the region below Tλ where the effect is the greatest. 4He films of 238, 285, and 340 Åthickness are adsorbed on N-doped silicon substrates with roughness ≈ 8 Å. The Casimir force scaling function , deduced from the thinning of these three films, collapses onto a single universal curve, attaining a minimum = -1.30 0.03 at x=td1/ν=-9.7 0.8 Å1/ν. The collapse confirms the finite-size scaling origin of the dip in the film thickness. Separately, we also confirm the presence down to 2.13 K of the Goldstone/surface fluctuation force, which makes the superfluid film 2 Å thinner than the normal film.

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