Microscopic Model of Critical Current Noise in Josephson Junctions
Abstract
We present a simple microscopic model to show how fluctuating two--level systems in the Josephson junction tunnel barrier of thickness L can modify the potential energy of the barrier and produce critical current noise spectra. We find low frequency 1/f noise that goes as L5. Our values are in good agreement with recent experimental measurements of critical current noise in Al/AlOx/Al Josephson junctions. We also investigate the sensitivity of the noise on the nonuniformity of the tunnel barrier.
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