Frequency Following Imaging of Electric Fields from Resonant Superconducting Devices using a Scanning Near-Field Microwave Microscope
Ashfaq S. Thanawalla, B. J. Feenstra, Wensheng Hu, D. E. Steinhauer, S. K. Dutta, Steven M. Anlage, F. C. Wellstood, Robert B. Hammond
Abstract
We have developed a scanning near-field microwave microscope that operates at cryogenic temperatures. Our system uses an open-ended coaxial probe with a 200 mm inner conductor diameter and operates from 77 to 300 K in the 0.01-20 GHz frequency range. In this paper, we present microwave images of the electric field distribution above a Tl2Ba2CaCu2O8 microstrip resonator at 77 K, measured at several heights. In addition, we describe the use of a frequency-following circuit to study the influence of the probe on the resonant frequency of the device.
Create a lesson
Related papers
High-Temperature Superconductivity of the Fe-Se-H compound
S. I. Bondarenko, A. A. Prokhorov, N. N. Galtsov et al.
Stabilization of Interband Phase Solitons in Two-Band Noncentrosymmetric Superconducting Rings
Yuriy Yerin, Boris Malomed, Stefan-Ludwig Drechsler et al.
Strain-driven orbital-selective reconstruction and bicollinear-to-stripe evolution in FeTe
Zhenfeng Ouyang, Yin Chen, Yi-Heng Tian et al.
Supercurrent detection and manipulation of topological phase transitions in Shiba-Majorana hybrid systems
Debika Debnath, Ioannis Ioannidis, Paramita Dutta et al.
Exact pair density wave in topological moire flat bands and universal superfluid stiffness
Zhengzhi Wu, Ming-rui Li, Hong Yao
Electrical manipulation of oxygen stoichiometry in multiterminal YBa2Cu3O7-δ junctions
Daniel Stoffels, Caio C. Quaglio-Gomes, Nicolas Lejeune et al.