Visible, EUV, and X-ray Spectroscopy at the NIST EBIT Facility
J. D. Gillaspy, B. Blagojevic, A. Dalgarno, K. Fahey, V. Kharchenko, J. M. Laming, E. -O. Le Bigot, L. Lugosi, K. Makonyi, L. P. Ratliff, H. W. Schnopper, E. H. Silver, E. Takacs, J. N. Tan, H. Tawara, K. Tokési
Abstract
After a brief introduction to the NIST EBIT facility, we present the results of three different types of experiments that have been carried out there recently: EUV and visible spectroscopy in support of the microelectronics industry, laboratory astrophysics using an x-ray microcalorimeter, and charge exchange studies using extracted beams of highly charged ions.
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