Multiplicative noise in the longitudinal mode dynamics of a bulk semiconductor laser

Abstract

We analyze theoretically and experimentally the influence of current noise on the longitudinal mode hopping dynamics of a bulk semiconductor laser. It is shown that the mean residence times on each mode have different sensitivity to external noise added to the bias current. In particular, an increase of the noise level enhances the residence time on the longitudinal mode that dominates at low current, evidencing the multiplicative nature of the stochastic process. A two-mode rate equation model for semiconductor laser is able to reproduce the experimental findings. Under a suitable separation of the involved time scales, the model can be reduced to a 1D bistable potential system with a multiplicative stochastic term related to the current noise strength. The reduced model clarifies the influence of the different noise sources on the hopping dynamics.