Qubit measurement using a quantum point contact with a quantum Langevin equation approach
Bing Dong, Norman J. M. Horing, X. L. Lei
Abstract
We employ a quantum Langevin equation approach to establish non-Markovian dynamical equations, on a fully microscopic basis, to investigate the measurement of the state of a coupled quantum dot qubit by a nearby quantum point contact. The ensuing Bloch equations allow us to examine qubit relaxation and decoherence induced by measurement, and also the noise spectrum of meter output current with the help of a quantum regression theorem, at arbitrary bias-voltage and temperature. Our analyses provide a clear resolution of a recent debate concerning the occurrence of a quantum oscillation peak in the noise spectrum.
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