Statistics of electron tunneling in normal tunnel junctions
P. J. Hakonen, A. Paila, E. B. Sonin
Abstract
Statistics of electron tunneling in normal tunnel junctions is studied analytically and numerically taking into account circuit (environment) effects. Full counting statistics, as well as full statistics of voltage and phase have been found for arbitrary times of observation. The theoretical analysis was based on the classical master equation, whereas the numerical simulations employed standard Monte-Carlo methods.
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