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Microwave Resonance and Carrier-Carrier Interaction in Two-Dimensional Hole Systems at High Magnetic Field

C. -C. Li, J. Yoon, L. W. Engel, D. Shahar, D. C. Tsui, M. Shayegan

cond-mat.mes-hallarXiv:cond-mat/9810066

Abstract

Microwave frequency conductivity, Re(σxx), of high quality two-dimensional hole systems (2DHS) in a large perpendicular magnetic field (B) is measured with the carrier density (ns) of the 2DHS controlled by a backgate bias. The high B insulating phase of the 2DHS exhibits a microwave resonance that remains well-defined, but shifts to higher peak frequency (fpk) as ns is reduced. Over a wide range of ns, fpk ns-1/2 is observed for the two samples we measured. The data clearly indicate that both carrier-carrier interactions and disorder are indispensable in determining the dynamics of the insulator. The ns dependence of fpk is consistent with a weakly pinned Wigner crystal in which domain size increases with ns, due to larger carrier-carrier interaction.

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