Scanned Potential Microscopy of Edge and Bulk Currents in the Quantum Hall Regime
Kent L. McCormick, Michael T. Woodside, Mike Huang, Mingshaw Wu, Paul McEuen, Cem Duruoz, J. S. Harris
Abstract
Using an atomic force microscope as a local voltmeter, we measure the Hall voltage profile in a 2D electron gas in the quantum Hall (QH) regime. We observe a linear profile in the bulk of the sample in the transition regions between QH plateaus and a distinctly nonlinear profile on the plateaus. In addition, localized voltage drops are observed at the sample edges in the transition regions. We interpret these results in terms of theories of edge and bulk currents in the QH regime.
Create a lesson
Related papers
Magnon Klein paradox
D. Wang
Transport kinetics in excitonic Mott insulator
W. J. Brunner, Zhiwen Zhou, Luc M. Nguyen et al.
Direct Observation of Chirality-Dependent Berry Curvature Dipole via Cross-Axial Nonlinear Hall Effect in Trigonal Te
Jaehyun Lee, Junhee Shin, Daryll J. C. Dalayoan et al.
Establishing the role of thickness in LaOBr; an alternative gate dielectric for vdW heterostructures
Isaac Antoine Lagaud, Justin Boddison-Chouinard, Antoine Labbé et al.
Electric-dipole-induced nuclear electric resonance in silicon
Jiyun Su, Shihang Zhang, Peihao Huang
Parametric Glassiness in Graphene-based Electronic Lévy Glass
Caue N. da Silva, Diego B. Fonseca, Adauto J. F. de Souza et al.