Scanned Potential Microscopy of Edge States in a Quantum Hall Liquid
Michael T. Woodside, Chris Vale, Kent L. McCormick, Paul L. McEuen, C. Kadow, K. D. Maranowski, A. C. Gossard
Abstract
Using a low-temperature atomic force microscope as a local voltmeter, we measure the Hall voltage profile in a quantum Hall conductor in the presence of a gate-induced non-equilibrium edge state population at n=3. We observe sharp voltage drops at the sample edges which are suppressed by re-equilibrating the edge states.
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