Photoionization rates of oxygen and nitrogen at 800 nm measured by Thomson coherent microwave scattering
K. Reindersma, M. Malaussena, S. Anantaram, K. Patel, V. Kumar, N. Babusis, M. Slipchenko, A. Shashurin
Abstract
In this study, we report on the use of Thomson coherent microwave scattering (CMS) to characterize photoionization rates in oxygen and nitrogen at 800 nm over a range spanning approximately three orders of magnitude, from about mid-109 s-1 range to the to mid-1012 s-1 range, corresponding to laser intensities in the vicinity of 1013-1014 W/cm2, a range of significant practical relevance to filamentation physics.
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